Development of a simple 'DLTS’ system for characterization of impurities and defects in semiconductors

Simple item page
dc.contributor.authorBegum, Ms Tahmina
dc.date.accessioned2025-03-19T08:40:10Z
dc.date.available2025-03-19T08:40:10Z
dc.date.issued2025-03-19
dc.descriptionThis thesis is submitted for the degree of Master of Philosophy.
dc.identifier.otherhttp://repository.library.du.ac.bd:8080/xmlui/handle/123456789/4010
dc.identifier.urihttp://repository.library.du.ac.bd:8080/xmlui/handle/123456789/4010
dc.language.isoen
dc.publisher© University of Dhaka
dc.sourceDhaka University Institutional Repository
dc.titleDevelopment of a simple 'DLTS’ system for characterization of impurities and defects in semiconductors
dc.typeThesis

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
535.84 BED_382863_Development of a simple 'DLTS’ system for characterization of impurities and defects in semiconductors_Ms Tahmina Begum.pdf
Size:
4.61 MB
Format:
Adobe Portable Document Format
Download

Collections

MPhil Thesis