Analytical Modeling of Silicon Nanowire Transistor - Effect of Width Variation

dc.contributor.authorAhmed, Rokhsana
dc.contributor.authorMahmud, Ruhana Parvin
dc.date.accessioned2018-09-25T09:56:40Z
dc.date.available2018-09-25T09:56:40Z
dc.date.issued5/11/2015
dc.descriptionThis thesis submitted in partial fulfillment of the requirements for the degree of B.Sc in Electrical and Electronic Engineering of East West University, Dhaka, Bangladesh.
dc.description.abstractThe effect of width variation of a Silicon nanowire MOSFET is studied in this work. We considered a ballistic gate-all-around Silicon nanowire MOSFET. The eigen energies of the time independent Schrodinger’s equation were found by solving the Bessel’s function. The eigen energies were used to find the drain current. We have used an analytical compact model to calculate the drain current. The effect of width variation on the drain current, transfer characteristics, transconductance, subthreshold swing, saturation current and saturation current density of the device are investigated. According to our observation the subthreshold swing decreases and the peak of transconductance increases as the wire widens. Saturation current increases with increase in width. Increase in saturation current density with decrease in wire width is an important motivation for choosing narrow wires in MOSFETs.
dc.identifier.otherhttp://dspace.ewubd.edu:8080/handle/2525/2735
dc.identifier.urihttp://dspace.ewubd.edu/handle/2525/2735
dc.language.isoen_US
dc.publisherEast West University
dc.sourceEast West University Institutional Repository
dc.subjectAnalytical Modeling of Silicon Nanowire Transistor, Width Variation
dc.titleAnalytical Modeling of Silicon Nanowire Transistor - Effect of Width Variation
dc.typeThesis

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