Testability analysis of complementary pass transistor logic circuits

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dc.contributor.advisorHarun-ur-Rashid, Dr. A. B. M.
dc.contributor.authorMuzahidul Karim, Mohammad
dc.date.accessioned2016-08-16T03:30:52Z
dc.date.available2016-08-16T03:30:52Z
dc.date.issued2001-06-26
dc.description.abstractFor abstracts please see full text
dc.identifier.otherhttp://lib.buet.ac.bd:8080/xmlui/handle/123456789/3656
dc.identifier.urihttp://lib.buet.ac.bd:8080/xmlui/handle/123456789/3656
dc.language.isoen
dc.publisherDepartment of Electrical and Electronic Engineering, BUET
dc.sourceBUET Institutional Repository
dc.subjectTestability analysis
dc.subjectComplementary pass
dc.subjectTransistor logic circuit
dc.titleTestability analysis of complementary pass transistor logic circuits
dc.typeThesis-MSc

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