Test case generation for event driven systems using 4-way input test strategy

dc.contributor.authorRahman, Mostafijur
dc.contributor.authorOthman, Rozmie Razif
dc.contributor.authorAhmad, R Badlishah
dc.contributor.authorRahman, Md. Mijanur
dc.date.accessioned2018-09-24T07:12:43Z
dc.date.accessioned2019-05-27T09:59:34Z
dc.date.available2018-09-24T07:12:43Z
dc.date.available2019-05-27T09:59:34Z
dc.date.issued2016-04-11
dc.description.abstractSince 1990's Combinatorial explosion is a crucial topic in software testing domain. In this domain the exhaustive input interaction test is not practical solution to test all software configurations for generating test cases. T-way test strategy provides a solution to overcome the problem. To date, most of the research on designing methods focus on combinations of input parameter values, where the T-way test strategy is applied to generate final test cases. However the methods are not applicable for event driven systems, where inputs are tested in the ordered form. In this paper a new method is proposed on T-way strategy to generate test cases using 4-way input interaction technique. The generated test cases are compared with the existing 4-way strategies. Result shows that in most cases the proposed method is able to generate efficient test cases compared with existing 4-way methods. Full Text Link: http://doi.org/10.1109/SCORED.2015.7449422
dc.identifier.otherhttp://dspace.daffodilvarsity.edu.bd:8080/handle/20.500.11948/3302
dc.identifier.urihttp://hdl.handle.net/20.500.11948/3302
dc.language.isoen
dc.publisherIEEE Xplore
dc.sourceDIU Institutional Repository
dc.subjectAlgorithm design and analysis
dc.subjectTesting
dc.subjectSoftware
dc.subjectHeuristic algorithms
dc.subjectConferences
dc.subjectResearch and development
dc.subjectComputers
dc.titleTest case generation for event driven systems using 4-way input test strategy
dc.typeArticle

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