Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming

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Date

2019

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BRAC University

Abstract

This internship report mainly focuses on Investigating the IV characteristic curve of diode and resistor using Keihley 2450 source meter operated by lab view programming. Using the Lab view programming such configuration was made where voltage is supplied and the corresponding current had been calculated for several points for both diode and resistor. A voltage versus Current graph was plotted using Origin lab according to the data from the setup and was investigated and compared with the theoretical properties of the diode and resistor with authentic reference. The measured data followed the theory and almost gave the same characteristic curves which proves that the programming in Labview and the setup in Keithley 2450 source meter was accurate for the measurement.

Description

This internship report is submitted in partial fulfillment of the requirements for the degree of Bachelor of Applied Physics and Electronics, 2019.
Cataloged from PDF version of internship report.
Includes bibliographical references (page 18).

Keywords

Keihley 2450, IV characteristic curve, Source Meter source measure unit, Resistor

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