Browsing by Author "Rahman, Tasnim Ikra"

Filter results by typing the first few letters
Now showing 1 - 2 of 2
  • No Thumbnail Available
    Item
    Design and Development of Bi Directional Power Meter Using Microcontroller
    (Indonesian Journal of Electrical Engineering and Computer Science, Institute of Advanced Engineering and Science, 2020-03-03) Rahman, Tasnim Ikra; Rashid, Anika Fariha; Rahman, Md. Habibur
    The significance of power or energy measurement has been very acute in recent times with the increase of Grid-Tied Solar PV system that needs Net-Metering. Power can be flown in both directions, from grid to load or from load (PV- Panel) to grid line. If power flow from both side is not calculated and surplus power which is not being used at the time instant is not stored, accurate billing is not possible. That is why a bidirectional power meter is required which can measure both the positive and negative power at any instant. The aim of this paper is to develop a bidirectional power meter using microcontroller. The work of this paper constitutes a microcontroller, a current sensor, bulbs as load and a display. The rms values of voltage and current is determined and showed in the display. Then the calibration is done inside the developed program. After that the power is calculated and showed in the display. Then the direction of the power is determined depending on the direction (whether positive or negative) of the power which is also dependent on the phase difference between the voltage and current. If there is no phase difference between the voltage and current, then the power is positive and leaving from the grid. If there is 180 degree phase difference between the voltage and current, then the power is negative and entering to the grid. The direction of the power flow is very important for efficiently of the proposed meter. For some defined load the accuracy of the developed meter is calculated as 94%.
  • Thumbnail Image
    Item
    Fault Diagnosis Methods in Analog and Mixed Signal Circuits
    (Daffodil International University, 2019-07-01) Rahman, Tasnim Ikra
    Fault identification of analog and mixed signal circuits is very difficult topics for previous few decades. Localization of hard and soft faults in analog circuit is often a troublesome task without a transparent cut methodology. For manufacturing process of Very Large Scale Integration (VLSI) Application Specific Integrated Circuits (ASICs) both fault diagnosis and localization are mandatory. The importance of such analog test has become important due to enhancement of networking and communication sector. This paper gives a brief review on the faults present in analog circuits and different diagnosis methodologies of these faults. Comparison of detection is also demonstrated among some techniques for some of the ITC97 Benchmark circuits.